Skyline specialise in creating tailored custom modular exhibition and trade show stands as well as portable display solutions. Our first class services include. ![]() D software. Free online 3. D model converter. Jun. 2. 7, 2. 01. Alexander Gessler wrote a small handy tool that converts 4. D file formats to OBJ, STL and others. Supported input file formats include 3. DS, FBX, Blender, OBJ, DXF, LWO, STL, PLY and more than 2. DMC 2. 01. 73. D Metrology Conference - 3. DMC3. DMC is a conference and exhibition dedicated to the application and development of 3. D measurement technology for industrial, scientific and cultural purposes. After the successful start of the. Aachen in 2. 01. 6, the organizing committee is dedicated to open the. DMC 2. 01. 7 will again. Aachen. 3. DMC aims at end users of 3. D metrology systems, equipment and software suppliers, service providers, researchers and procurement and quality managers. These target audiences operate in sectors such as aerospace, automotive, power generation, marine, off- shore, built environment, cultural heritage and virtual reality. Users and developers from these diverse fields can share their. Typical conference themes include. Technologies and applications of portable coordinate metrology from meso to large scale. Fixed 3. D metrology on the micro to meso scale. D metrology for advanced manufacturing. Automation and in- process metrology. Future industrial requirements and next- generation technologies. Augmented reality. Measurement uncertainty and traceability. Additive manufacturing. Nondestructive testing. We welcome presentations of applications at all scales, from the reverse engineering and inspection of small parts to the as- built 3. D modelling of entire process plants. Whilst portable methods drive many developments in 3.
D metrology, we also. NDT). Visit Aachen this October to. D metrology and to contribute to the community. Conference format: We request presentations only, no papers. The presentations will cover both applications- oriented and research- oriented subjects and will be publicly available in electronic format after the event. Benefits for Delegates: Hear presentations from experts on a spectrum of topics related to 3. D metrology problems and solutions. :: Exhibition :: The place to share and show off projects Until someone finds a way to categorize what is here, be sure to remember that your browser has a "find in.Discuss your own work with the 3. D metrology community. Get hands- on experience regarding the latest systems from major manufacturers. Exchange knowledge and network with like- minded professionals. Find many of your suppliers at one exhibition. Discover the latest industry trends and best practice. Interact with various parties from the metrology industy including developers, decision makers and vendors. Broaden your knowledge about the latest hard- and software in metrology. Understand the challenges of your market companions and how they are solving them. Benefits for Exhibitors: Meet new customers from a diverse range of industrial and research sectors. Initiate workshops on specific applications of your products. Engage with an audience specifically interested in 3. D measurement. Extend your European contact base. Learn about new and upcoming applications and industry requirements. Share discovieries and advancements. Compare best practice solutions. Present your success stories to conference attendees. Key figures from last year's 3. DMCImpressions from last year's 3. DMCIndustrial Advisory Board 2. Exhibitors currently registered for 2. Monday, Oct. 9, Location: WZL1. Registration. Registration remains open through the day. Workshop: Robot Performance Testing with Lasertracker and Acive Target Based on ISO 9. Workshop: Computertomography for Dimensional Measurements and Corrections of Complex Parts. Workshop: Advanced Geometric Dimensioning, Tolerancing and Fitting Software for Optimized Design and Manufacturing. Parallel workshops offered repeatedly. Presentation of the e. GO Life 1. 8: 0. 0Poster Session (Posters listed below schedule.)Fingerfood & Drinks Tuesday, Oct. Location: Tivoli. Registration,Morning Coffee. Plenary Opening (R. Schmitt, B. Hughes)Metrology as the Fundamental Enabler for Industry 4. Future of Manufacturing. Ben Adeline(Insphere Ltd.)The Quality Information Framework (QIF) in Digital Manufacturing. Daniel Campbell(Capvidia)0. Coffee Break. 09: 4. Augmented Reality for Feedback of 3. D Data in Aerospace Apps. Jim Heley(A3. L Ltd.)Supporting Part Inspection with MR Headset (Hololens)David Canepa Talamas(University of Bath, LIMA)1. Exhibition Opening (S. Kyle)Exhibition remains open through the day. Lunch. 13: 0. 0Exhibition Time. Espresso. 13: 3. 0Smart Metrology for a Production- Integrated SPC Network Structure. André Kreul(General Electric Switzerland Gmb. H)On- Machine Inertial Sensors to Determine Machine- Tool Geometric Errors. Gregory Vogl(National Institute of Standards and Technology)1. Integrated Measurement Technology for Self- Monitoring Machine Tools. Marcus Queins(Starrag Technology Gmb. H)High- Precision Dimensional Metrology on Large- Size Rolling Bearings. Stepan Matousek(Schaeffler Technologies AG & Co. KG)1. 5: 3. 0Exhibition Time. Coffee. 16: 1. 5Comparing CMMs and Laser Radar. Tom Hedges(Nikon Metrology, Inc.)Flexible Optical Serial Measurement Process in the Car Body Manufacturing. Hanqing Zheng(Daimler AG)1. D Measurement of Jet Engine Compressor Aerofoils on Blisks for Vibration Analysis. Martin Harding(Rolls- Royce Deutschland Ltd & Co KG)Inline Metrology for Advanced Optics Manufacture. Christian Wenzel(Innolite Gmb. H)Closing of Day 2 (R. Schmitt)1. 8: 1. 5Exhibition Time. Poster Session. Refreshments. Dinner. 20: 0. 0Networking. Walheimer Big Band feat. Julia Walbergs. Open Bar. Wednesday, Oct. 1. Location: Tivoli. Morning Coffee. 08: 3. Opening of Day 3 (B. Hughes)3. D Scanner Based on Frequency Modulated Continuous Wave Laser. Tatsuo Hariyama(Hitachi Ltd.)New Concept for Accurate Self- Calibrating Multi- Target 3. D Metrology. Mike Campbell(National Physical Laboratory)0. Coffee Break. 09: 4. Scanner and IR Camera Combination for NDT Measurement of Pipes etc. Somayeh Hesabi(Université Laval)Radio Telescope Inspection by Terrestrial Laser Scanner. Christoph Holst(Rheinische Friedrich- Wilhelms- Universität Bonn)1. Exhibition Time. Exhibition remains open through the day. Lunch. 13: 0. 0Exhibition Time. Espresso. 13: 3. 0A Medium Format Camera for High Accuracy Photogrammetry. Heidi Hastedt(Jade University of Applied Sciences Oldenburg)Feature- Based Modelling for Pose Estimation of Geometric Elements. Gorka Kortaberria(IK4- TEKNIKER)1. Adaptive Quality Control Loops for High Precision Components. Raphael Wagner(Karlsruhe Institute of Technology)ADM Laser Tracking Using Femtosecond Frequency Comb. Weihu Zhou(Chinese Acad. Sci.)1. 5: 3. 0Exhibition Time. Coffee. 16: 1. 5Integration Information Data Flow for Improved Manufacturing Quality. Toby Maw(Manufacturing Technology Centre )Standard for Performance Measurement of CT Systems. Michael Mc. Carthy(Engineering Metrology Solutions Ltd.)1. Design for Verification and the Use of Metrology within Industry 4. Andy Francis(GKN Aerospace plc)Optimization for Journal Machining. Jannik Lüpfert(Siemens AG)Farewell (B. Hughes, R. Schmitt)1. Exhibition Time 1. Shuttling to City Center. Casual Networking. Meeting Point: Domkeller Aachen. Outlook for 3. DMC 2. Posters. The following poster exhibitions have been confirmed by the authors after the acceptance of their respective abstracts. Please note that this list is still subject to frequent changes. Michiel Boes(Pozyx BVBA)Algorithms for Positioning Systems. Andrea Egidi(INRi. M)The Influence of Scanning Parameters on CMM Measurements. Zoya Fomkina(VNIIM)Large Volume Metrology Capabilities at VNIIMGianfranco Genta(Politecnico di Torino)Ball- Plate Based Calibration of a 3. D Laser Triangulation Scanner. Solomon Kamagusa(CERN)High- Accuracy Measurement System Using FSI and Multilateration Nico Lehmann(Siemens AG)Traceable On- Machine Measurements of Gas Turbine Parts. Katharina Richter(RWTH, WZL)Making X- Ray Tomography a More Universal Tool. Mirko Riedel(TU Dresden)Photogrammetric 6. DOF Measurement on Machine Tools. Petros Stavroulakis(University of Nottingham)Efficient Measurement of Complex Form by Occlusion Avoidance. Zheng Wang(University of Bath, LIMA)Real- Time Laser Tracker Compensation of Robotic Machining. Marielouise Zaiß(Karlsruhe Institute of Technology)Measurement Uncertainty of Triangulation Scanning of Composite Sheets. We are delighted to bring together internationally leading expertise to an open forum for presentations and discussions focused on 3. D metrology. Posters. Lorem Ipsum Dolor, Max Mustermann (University of Mac. Gyver)Laboratory for Machine Tools and Production Engineering (WZL). The WZL at the RWTH Aachen University undertakes basic research and offers projects and consultancy focused on industrial requirements. These projects deliver innovative and practical solutions which contribute to successful business development.
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